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Surface & thin film characterization   

Surface and thin film properties are extremely important in all kinds of applications – from semiconductors, data storage and flat-screen displays to lamps, toys and paper. Philips Innovation Labs offers a wide range of analytic services that let you measure those properties with outstanding accuracy.  

Application examples:

  • Surface contamination: identification of components and contamination sources
  • Root cause analysis of black spots in lamps and displays, stains and coating defects
  • Dopant profiling in semiconductor devices
  • Thermal expansion of thin layers
  • Surface roughness and step coverage 
  • Adhesion and delamination: mechanical tests and interface analysis
  • Strain and stress in thin films and bulk materials
  • Permeability of foils
  • Characterisation of self-assembled monolayers and biomolecule adsorption


Our high-precision analytic tools include electron microscopy (SEM, TEM, FIB), electron spectroscopy (XPS, AES), X-ray diffraction (XRD, XRR), ellipsometry, scanning probe techniques (AFM, SKPM, STM, ..), elemental analysis techniques (RBS, SIMS, LA-ICP-MS), molecular analysis techniques (FT-IR, Raman) and much more.

Your technical contact

Marcel Verheijen 
Senior Technologist Advanced Imaging 
Phone: +31 6 21 17 42 27

Your general contact

Ben Broers
Business Development Manager
Phone: +31 40 27 48883