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Compositional analysis   


With cutting-edge facilities and in-depth know-how, we help you accurately determine the chemical composition of materials and objects.

We can identify the make-up – from the main constituents to ultra traces – of bulk materials, thin layers, solutions and gases. Through this analysis, we provide support in R&D, quality control, reliability issues and problem solving in general.

 

There are no restrictions in advance as we pride ourselves on being able to offer solutions for any type of material. We have experience with specific sample handling to avoid even low-level contamination, pre-treatment to allow subsurface analysis and we even develop remote, non-destructive tools for at-line applications.

 

Compositional analysis is also a firm foundation under a range of Quality & Reliability related competences, allowing in-house characterization of any type of material by people with both technical and application expertise.

Application examples:

 

  • Accurate composition of thin layers, glasses, ceramics, composites, metals and alloys
  • Trace contaminants in cleanroom air
  • Valence state of metals in oxidic materials
  • Surface contamination
  • Traces in dielectric materials
  • Concentration of rare-earth elements in phosphors and organic lipids
  • In-situ, in-line and at-line monitoring of chemical processes
  • Total organic carbon in gas-systems
  • Leak detection methods

Techniques:

 

F-AAS, GF-AAS, CV-AAS, Elemental Analysis, FT-IR, GC-MS, HPLC, ICP-AES, ICP-MS), IC-MS, LA-ICP-MS, MALDI, NTM, NMR, Gravimetry, Radiochemistry, Raman, Titrimetry, Thermal desorption, XRF

Meet our experts

Your technical contact

Marcel Verheijen 
Senior Technologist Advanced Imaging 
Phone: +31 6 21 17 42 27
m.a.verheijen@philips.com

Your general contact

Ben Broers
Business Development Manager
Phone: +31 40 27 48883
b.m.f.broers@philips.com